DocumentCode
3447011
Title
Degradation of Cu(In, Ga)Se2 thin-film solar cell due to electrostatic discharge
Author
Okumura, Teppei ; Toyoda, Kazuhiro ; Kawakita, Shirou ; Imaizumi, Masayuki ; Cho, Mengu
Author_Institution
Japan Aerosp. Exploration Agency, Tsukuba, Japan
fYear
2009
fDate
7-12 June 2009
Abstract
The discharge tests on CIGS arrays were performed in a vacuum chamber which simulates the plasma environment in low Earth orbit and the high-energy electron environment in geostationary orbit. Although no dielectric parts exist on CIGS array, the discharge occurred on the surface and caused cell degradation. The discharge track worked as a leak resistance. To avoid discharge on the surface, it is necessary to cover CIGS array with a transparent film.
Keywords
copper compounds; electrostatic discharge; semiconductor thin films; solar cells; CIGS arrays; Cu(InGa)Se2; cell degradation; dielectric parts; discharge tests; discharge track; electrostatic discharge; geostationary orbit; high-energy electron environment; leak resistance; low Earth orbit; plasma environment; thin-film solar cell; transparent film; vacuum chamber; Degradation; Dielectric materials; Electrons; Low earth orbit satellites; Photovoltaic cells; Plasma simulation; Plasma temperature; Surface discharges; Transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location
Philadelphia, PA
ISSN
0160-8371
Print_ISBN
978-1-4244-2949-3
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2009.5411619
Filename
5411619
Link To Document