• DocumentCode
    3447011
  • Title

    Degradation of Cu(In, Ga)Se2 thin-film solar cell due to electrostatic discharge

  • Author

    Okumura, Teppei ; Toyoda, Kazuhiro ; Kawakita, Shirou ; Imaizumi, Masayuki ; Cho, Mengu

  • Author_Institution
    Japan Aerosp. Exploration Agency, Tsukuba, Japan
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    The discharge tests on CIGS arrays were performed in a vacuum chamber which simulates the plasma environment in low Earth orbit and the high-energy electron environment in geostationary orbit. Although no dielectric parts exist on CIGS array, the discharge occurred on the surface and caused cell degradation. The discharge track worked as a leak resistance. To avoid discharge on the surface, it is necessary to cover CIGS array with a transparent film.
  • Keywords
    copper compounds; electrostatic discharge; semiconductor thin films; solar cells; CIGS arrays; Cu(InGa)Se2; cell degradation; dielectric parts; discharge tests; discharge track; electrostatic discharge; geostationary orbit; high-energy electron environment; leak resistance; low Earth orbit; plasma environment; thin-film solar cell; transparent film; vacuum chamber; Degradation; Dielectric materials; Electrons; Low earth orbit satellites; Photovoltaic cells; Plasma simulation; Plasma temperature; Surface discharges; Transistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411619
  • Filename
    5411619