• DocumentCode
    3449024
  • Title

    Effect of light intensity on performance of silicon-based thin film solar cells

  • Author

    Yunaz, Ihsanul Afdi ; Kasashima, Shunsuke ; Inthisang, Sorapong ; Krajangsang, Taweewat ; Miyajima, Shinsuke ; Yamada, Akira ; Konagai, Makoto

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    Theoretical and experimental studies were performed to explore the effect of light intensity on the performance of silicon-based thin film solar cells. The theoretical study was conducted using AMPS-1D (Analysis of Microelectronic and Photonic Structures) to analyze how the device structure affects the performance of silicon-based solar cells under various concentration ratios of sunlight. We calculated a-Si:H and ¿c-Si:H p-i-n type single-junction solar cells, and also experimentally evaluated a-Si:H, a-SiO:H and ¿c-Si:H solar cells. From both simulation and measurement results, we confirmed that the Voc logarithmically increases with increasing the light intensity. Moreover, from simulation results, we also observed that the defect density and thickness of i-layer strongly influence the light-intensity dependence of a-Si:H solar cells.
  • Keywords
    amorphous semiconductors; hydrogen; semiconductor heterojunctions; semiconductor thin films; silicon; silicon compounds; solar cells; AMPS-1D; Si:H; SiO:H; analysis of microelectronic and photonic structures; defect density; light intensity; p-i-n type single-junction solar cells; sunlight concentration ratios; thin film solar cells; Amorphous silicon; Analytical models; Glass; Microelectronics; Optical filters; PIN photodiodes; Performance analysis; Photoconductivity; Photovoltaic cells; Semiconductor thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411706
  • Filename
    5411706