• DocumentCode
    3449295
  • Title

    Progress on the Quantum Capacitance Standard at Metas

  • Author

    Hof, C. ; Jeanneret, B. ; Eichenberger, A.L. ; Overney, F. ; Lotkhov, S.

  • Author_Institution
    Swiss Fed. Office of Metrol. & Accreditation, METAS, Bem-Wabem
  • fYear
    2004
  • fDate
    38139
  • Firstpage
    546
  • Lastpage
    547
  • Abstract
    At the Swiss Federal Office of Metrology and Accreditation (METAS) a quantum primary standard of capacitance based on single electron tunneling devices is under development. In this paper we report on the progress made so far as well as on the current work towards the realization of this standard
  • Keywords
    capacitance measurement; measurement standards; single electron devices; tunnelling; quantum capacitance standard; single electron tunneling devices; Accreditation; Current measurement; Electrons; Metrology; NIST; Quantum capacitance; Stability; Temperature; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2004 Conference on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-8494-6
  • Electronic_ISBN
    0-7803-8494-6
  • Type

    conf

  • DOI
    10.1109/CPEM.2004.305354
  • Filename
    4097365
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3449295