DocumentCode
3449950
Title
Ballistic electron microscopy of a metal molecule interface
Author
Kunardi, Linda ; Yi, Zheng ; Troadec, Cedric ; Lwin, Ma Han Thu ; Knoll, Wolfgang ; Chandrasekhar, N.
Author_Institution
Institute of Materials Research and Engineering, 3 Research Link, Singapore 117602
fYear
2006
fDate
10-13 Jan. 2006
Firstpage
194
Lastpage
196
Abstract
We present studies on a Ag/ HS–(CH2)4 –T3 –H (T3C4SH)/ Au diode using nanometer scale resolution, ballistic electron emission microscopy (BEEM). Images show spatially non-uniform carrier injection. A WKB calculation is carried out and compared with the experimental data. The results indicate that molecular levels are being accessed in the BEEM experiment, since the measured currents are larger than purely tunneling contribution. Our results are consistent with previously published results on a similar molecule [ 1]. Physical origins of the non-uniform carrier injection and its implications are discussed.
Keywords
Current measurement; Electron emission; Electron microscopy; Gold; Indium; Physics; Schottky diodes; Silver; Spectroscopy; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies - Nanoelectronics, 2006 IEEE Conference on
Print_ISBN
0-7803-9357-0
Type
conf
DOI
10.1109/NANOEL.2006.1609710
Filename
1609710
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