DocumentCode
3451402
Title
Monte Carlo simulation of HEMT
Author
Ueno, H. ; Yamakawa, S. ; Hamaguchi, C. ; Miyatsuji, K.
Author_Institution
Dept. of Electron. Eng., Osaka Univ., Japan
fYear
1995
fDate
7-9 Nov 1995
Firstpage
85
Lastpage
89
Abstract
Device simulation of HEMT (High Electron Mobility Transistor) has been carried out by ensemble Monte Carlo simulation. Since the electrons in HEMT are confined in GaAs region at the GaAs-AlGaAs hetero-interface, their motion is two-dimensional when the electron energy is low and thus we have to take into account the quantization of electrons at the interface. In order to develop a realistic device simulator of HEMT, we divide the channel region in meshes, and Schrodinger and Poisson equations are solved self-consistently to obtain electronic states of the two-dimensional electrons in a mesh. In addition the real space transfer from GaAs layer into AlGaAs barrier layer is taken into account
Keywords
III-V semiconductors; Monte Carlo methods; Schrodinger equation; aluminium compounds; gallium arsenide; high electron mobility transistors; semiconductor device models; GaAs-AlGaAs; GaAs-AlGaAs hetero-interface; HEMT; Monte Carlo simulation; Poisson equation; Schrodinger equation; channel region; device simulator; electronic states; real space transfer; two-dimensional electrons; Cities and towns; D-HEMTs; Electrons; Gallium arsenide; HEMTs; Monte Carlo methods; Particle scattering; Power engineering and energy; Quantization; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics and Computer Modeling of Devices Based on Low-Dimensional Structures, 1995. Proceedings., International Workshop on
Conference_Location
Aizu-Wakamatsu
Print_ISBN
0-8186-7321-4
Type
conf
DOI
10.1109/PCMDLS.1995.494965
Filename
494965
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