• DocumentCode
    3451402
  • Title

    Monte Carlo simulation of HEMT

  • Author

    Ueno, H. ; Yamakawa, S. ; Hamaguchi, C. ; Miyatsuji, K.

  • Author_Institution
    Dept. of Electron. Eng., Osaka Univ., Japan
  • fYear
    1995
  • fDate
    7-9 Nov 1995
  • Firstpage
    85
  • Lastpage
    89
  • Abstract
    Device simulation of HEMT (High Electron Mobility Transistor) has been carried out by ensemble Monte Carlo simulation. Since the electrons in HEMT are confined in GaAs region at the GaAs-AlGaAs hetero-interface, their motion is two-dimensional when the electron energy is low and thus we have to take into account the quantization of electrons at the interface. In order to develop a realistic device simulator of HEMT, we divide the channel region in meshes, and Schrodinger and Poisson equations are solved self-consistently to obtain electronic states of the two-dimensional electrons in a mesh. In addition the real space transfer from GaAs layer into AlGaAs barrier layer is taken into account
  • Keywords
    III-V semiconductors; Monte Carlo methods; Schrodinger equation; aluminium compounds; gallium arsenide; high electron mobility transistors; semiconductor device models; GaAs-AlGaAs; GaAs-AlGaAs hetero-interface; HEMT; Monte Carlo simulation; Poisson equation; Schrodinger equation; channel region; device simulator; electronic states; real space transfer; two-dimensional electrons; Cities and towns; D-HEMTs; Electrons; Gallium arsenide; HEMTs; Monte Carlo methods; Particle scattering; Power engineering and energy; Quantization; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics and Computer Modeling of Devices Based on Low-Dimensional Structures, 1995. Proceedings., International Workshop on
  • Conference_Location
    Aizu-Wakamatsu
  • Print_ISBN
    0-8186-7321-4
  • Type

    conf

  • DOI
    10.1109/PCMDLS.1995.494965
  • Filename
    494965