• DocumentCode
    3453951
  • Title

    Mode-matching analysis of substrate-integrated waveguide circuits

  • Author

    Bornemann, Jens ; Taringou, Farzaneh

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Victoria, Victoria, BC, Canada
  • fYear
    2011
  • fDate
    8-11 May 2011
  • Abstract
    A mode-matching approach is presented for the analysis of substrate-integrated waveguide (SIW) circuits. The numerical technique takes advantage of recently developed fabrication techniques employing rectangular-shaped via holes. Discontinuity models involving all-dielectric waveguides and sections with arbitrary numbers of vias are presented and combined into a powerful analysis tool which can be used straightforwardly for the design of SIW components. The influence of the overall substrate width on the circuit performance is investigated. It is found that the computational domain can be significantly reduced without impacting on the computed performances. A design example involving a back-to-back impedance transformer is presented. The results are verified by comparison with the commercially available field solver CST Microwave Studio.
  • Keywords
    dielectric waveguides; impedance convertors; substrate integrated waveguides; SIW components; all-dielectric waveguides; back-to-back impedance transformer; circuit performance; field solver CST Microwave Studio; mode-matching analysis; numerical technique; substrate-integrated waveguide circuits; Electromagnetic waveguides; Integrated circuit modeling; Microwave circuits; Microwave filters; Substrates; Transmission line matrix methods; Substrate-integrated waveguide technology; computer-aided design; mode-matching techniques; numerical modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering (CCECE), 2011 24th Canadian Conference on
  • Conference_Location
    Niagara Falls, ON
  • ISSN
    0840-7789
  • Print_ISBN
    978-1-4244-9788-1
  • Electronic_ISBN
    0840-7789
  • Type

    conf

  • DOI
    10.1109/CCECE.2011.6030517
  • Filename
    6030517