DocumentCode
3455258
Title
Yield optimization of electrical circuits
Author
Dorai, Arvind ; Ponnambalam, Kumaraswamy ; Heemink, Arnold W.
Author_Institution
Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
fYear
2009
fDate
6-8 Nov. 2009
Firstpage
1
Lastpage
3
Abstract
This paper presents a method for designing component values of electrical devices when design values are random. A polyhedral approximation of the feasible region is used to contain the high yield region of the random distributions modeled by the Kumaraswamy distribution. Evaluation of designed system is done with a Monte Carlo simulation.
Keywords
Monte Carlo methods; circuit optimisation; filters; Kumaraswamy distribution; Monte Carlo simulation; electrical circuits; electrical devices; feasible region polyhedral approximation; filter circuit; random distribution; yield optimization; Circuits and systems; Design engineering; Design methodology; Design optimization; Frequency response; Manufacturing; Optimization methods; Random variables; Signal design; Systems engineering and theory; Kumaraswamy distribution; Monte Carlo method; component with tolerance; yield optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Circuits and Systems (SCS), 2009 3rd International Conference on
Conference_Location
Medenine
Print_ISBN
978-1-4244-4397-0
Electronic_ISBN
978-1-4244-4398-7
Type
conf
DOI
10.1109/ICSCS.2009.5412285
Filename
5412285
Link To Document