• DocumentCode
    3455479
  • Title

    Textile fabric flaw detection using singular value decomposition

  • Author

    Mak, K.L. ; Tian, X.W.

  • Author_Institution
    Dept. of Ind. & Manuf. Syst. Eng., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2010
  • fDate
    21-23 June 2010
  • Firstpage
    381
  • Lastpage
    386
  • Abstract
    This paper proposes a textile fabric defect detection method based on the technique of matrix singular value decomposition (SVD). The matrix SVD extracts orthonormal eigen-vectors from training defect-free images of a fabric. These eigen-vectors carry structure features of the given fabric and are expressed in the format of image. For this fabric, the extracted structure features remain unchanged regardless of image sampling position as long as there is no defect. Thus the extracted structure features usually are used in projection based defect detection methods. Compared to model-based projection fabric defect detection methods, the proposed method only assumes that eigen-vectors are independent to each other. The proposed method is assessed with a number of defective fabric images. The results show that the proposed method achieves a high detection rate. In addition, factors related to such an excellent defect detection performance are also discussed.
  • Keywords
    eigenvalues and eigenfunctions; fabrics; feature extraction; flaw detection; image sampling; production engineering computing; singular value decomposition; image sampling position; orthonormal eigenvector; singular value decomposition; structure feature extraction; textile fabric flaw detection; training defect free image; Data mining; Fabrics; Feature extraction; Filters; Image texture analysis; Inspection; Manufacturing industries; Manufacturing systems; Singular value decomposition; Textiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Green Circuits and Systems (ICGCS), 2010 International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-6876-8
  • Electronic_ISBN
    978-1-4244-6877-5
  • Type

    conf

  • DOI
    10.1109/ICGCS.2010.5543033
  • Filename
    5543033