• DocumentCode
    3456788
  • Title

    Edge Detection of Impulse Noise Image Based on Quantum Collapsing Theory

  • Author

    Zhou, Changxiong ; Yan, Tingqin ; Lu, Chunmei ; Shang, Li ; Huang, Yan

  • Author_Institution
    Jiangsu Province Support Software Eng. R&D Center for Modern Inf. Technol. Applic. in Enterprise, Suzhou, China
  • fYear
    2010
  • fDate
    21-23 Oct. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    It is the key to select the appropriate structure elements in the edge detection using morphological gradient operator. A new quantum measurement is proposed in this paper based on quantum collapsing theory in which the possible noisy pixels are collapsed to state 0 while no participating in morphological operation. As the noise intensity increases, the size of the window of the structural elements of superposition states is adaptively increased and quantum collapsing morphological gradient operator is created. The experimental results on the edge detection of the image corrupted with impulse noise show that the proposed algorithm has strongly ability of anti-noise. The normalized mean square error of the new algorithm increases slowly with impulse noise intensity. Further more, the new algorithm is consistent with the traditional morphological gradient operator on noise-free image edge detection.
  • Keywords
    edge detection; gradient methods; image denoising; impulse noise; mean square error methods; quantum theory; edge detection; impulse noise image; impulse noise intensity; mean square error; morphological gradient operator; noisy pixel; quantum collapsing theory; quantum measurement; structure element; Electronic mail; Image edge detection; Mean square error methods; Noise; Noise measurement; Quantum mechanics; Signal processing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (CCPR), 2010 Chinese Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-7209-3
  • Electronic_ISBN
    978-1-4244-7210-9
  • Type

    conf

  • DOI
    10.1109/CCPR.2010.5659183
  • Filename
    5659183