• DocumentCode
    3459010
  • Title

    A novel ESD super-clamp structure for TVS applications

  • Author

    Bobde, Madhur ; Mallikarjunaswamy, Shekar ; Ho, Moses ; Hebert, Francois

  • Author_Institution
    Alpha & Omega Semicond., Sunnyvale, CA
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    897
  • Lastpage
    900
  • Abstract
    This paper presents a new ESD clamp structure for transient voltage suppressor (TVS) applications that combines the advantages of avalanche diode and bipolar transistor clamps. The device structure consists of a non-snapback avalanche diode triggered vertical NPN transistor. The avalanche diode provides the fast trigger and current conduction path at low currents, while the vertical NPN bipolar transistor turn-on provides alternate low resistance path for current conduction at high currents. The snapback in the IV characteristics is minimized by matching the avalanche diode breakdown voltage VBD and the vertical NPN transistor open base collector-emitter breakdown voltage, BVCEO- Measurements on fabricated devices show consistent results with the theory. The TVS has low leakage currents (< 25 nAmps), negligible snapback in the output characteristics (<0.5 Volts) and excellent clamping voltage at high currents (13.1 Volts @ 30 Amps of TLP current). The presence of low doped base region also results in 35 % decrease in the TVS capacitance.
  • Keywords
    avalanche breakdown; avalanche diodes; bipolar transistors; electrostatic discharge; ESD super-clamp structure; TVS applications; avalanche diode breakdown voltage; bipolar transistor clamps; collector-emitter breakdown voltage; current conduction path; nonsnapback avalanche diode; transient voltage suppressor; triggered vertical NPN transistor; Avalanche breakdown; Bipolar transistors; Breakdown voltage; Cathodes; Circuits; Clamps; Delay; Electrostatic discharge; Protection; Semiconductor diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522827
  • Filename
    4522827