DocumentCode
3459010
Title
A novel ESD super-clamp structure for TVS applications
Author
Bobde, Madhur ; Mallikarjunaswamy, Shekar ; Ho, Moses ; Hebert, Francois
Author_Institution
Alpha & Omega Semicond., Sunnyvale, CA
fYear
2008
fDate
24-28 Feb. 2008
Firstpage
897
Lastpage
900
Abstract
This paper presents a new ESD clamp structure for transient voltage suppressor (TVS) applications that combines the advantages of avalanche diode and bipolar transistor clamps. The device structure consists of a non-snapback avalanche diode triggered vertical NPN transistor. The avalanche diode provides the fast trigger and current conduction path at low currents, while the vertical NPN bipolar transistor turn-on provides alternate low resistance path for current conduction at high currents. The snapback in the IV characteristics is minimized by matching the avalanche diode breakdown voltage VBD and the vertical NPN transistor open base collector-emitter breakdown voltage, BVCEO- Measurements on fabricated devices show consistent results with the theory. The TVS has low leakage currents (< 25 nAmps), negligible snapback in the output characteristics (<0.5 Volts) and excellent clamping voltage at high currents (13.1 Volts @ 30 Amps of TLP current). The presence of low doped base region also results in 35 % decrease in the TVS capacitance.
Keywords
avalanche breakdown; avalanche diodes; bipolar transistors; electrostatic discharge; ESD super-clamp structure; TVS applications; avalanche diode breakdown voltage; bipolar transistor clamps; collector-emitter breakdown voltage; current conduction path; nonsnapback avalanche diode; transient voltage suppressor; triggered vertical NPN transistor; Avalanche breakdown; Bipolar transistors; Breakdown voltage; Cathodes; Circuits; Clamps; Delay; Electrostatic discharge; Protection; Semiconductor diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location
Austin, TX
ISSN
1048-2334
Print_ISBN
978-1-4244-1873-2
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2008.4522827
Filename
4522827
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