DocumentCode
3459059
Title
62nd ARFTG Microwave Measurements Conference (IEEE Cat. No. 03EX760)
fYear
2003
fDate
4-5 Dec. 2003
Abstract
The following topics are dealt with: microwave measurement; integrated circuit modeling; semiconductor device modeling; microwave integrated circuits; VNA calibration; triplexers; radio interference filter measurement; two-port networks; coplanar waveguides; power dividers and electric variables measurement.
Keywords
electric variables measurement; filters; integrated circuit modelling; microwave integrated circuits; microwave measurement; multiplexing equipment; power dividers; semiconductor device models; two-port networks; VNA calibration; coplanar waveguides; electric variables measurement; integrated circuit modeling; microwave integrated circuits; microwave measurement; power dividers; radio interference filter measurement; semiconductor device modeling; triplexers; two-port networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
Conference_Location
Boulder, CO, USA
Print_ISBN
0-7803-8195-5
Type
conf
DOI
10.1109/ARFTGF.2003.1459737
Filename
1459737
Link To Document