• DocumentCode
    3459768
  • Title

    Optimized impedance standard substrate designs for dual and differential applications

  • Author

    Lesher, Tim ; Hayden, Leonard ; Strid, Eric

  • Author_Institution
    Cascade Microtech Inc., Beaverton, OR, USA
  • fYear
    2003
  • fDate
    4-5 Dec. 2003
  • Firstpage
    197
  • Lastpage
    200
  • Abstract
    Optimized dual signal Impedance Standard Substrate (ISS) designs are demonstrated. The optimal designs had loop-under grounds, were selected for minimum deviation from lumped element behavior and used mode dampening structures. A comparison of existing design approaches is given and the quality of the designs is illustrated to 50 GHz.
  • Keywords
    electric impedance measurement; microwave measurement; millimetre wave measurement; network analysers; probes; standards; substrates; 50 GHz; differential applications; dual applications; dual signal impedance standard substrate; loop-under grounds; lumped element behavior; mode dampening structures; optimal designs; optimized impedance standard substrate designs; Calibration; Coplanar waveguides; Design optimization; Impedance; Microstrip; Probes; Signal design; Slotline; Substrates; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
  • Print_ISBN
    0-7803-8195-5
  • Type

    conf

  • DOI
    10.1109/ARFTGF.2003.1459773
  • Filename
    1459773