A 10 V Josephson Voltage Standard comparison between NIST and Inmetro as a link to BIPM

Author

Landim, R.P. ; Tang, Y. ; Afonso, E. ; Ferreira, V.

Author_Institution

Inst. Nac. de Metrologia, Normalizacao e Qualidade Ind., Rio de Janeiro, Brazil

fYear

2010

fDate

13-18 June 2010

Firstpage

189

Lastpage

190

Abstract

This paper describes a 10 V Josephson Voltage Standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (Inmetro) using automatic data acquisition. The results were in agreement to within 1.1 nV and the mean difference between the two JVSs at 10 V is 0.54 nV with a pooled combined standard uncertainty of 1.48 nV. Considering a recent JVS comparison between NIST and the Bureau International des Poids et Mesures (BIPM), the difference between Inmetro and the BIPM thus was found to be -0.26 nV with a standard uncertainty of 1.76 nV.

Keywords

Josephson effect; data acquisition; measurement standards; voltage measurement; BIPM; Bureau International des Poids et Mesures; Inmetro; Instituto Nacional de Metrologia, Normalização e Qualidade Industrial; Josephson voltage standard; NIST; National Institute of Standards and Technology; automatic data acquisition; pooled combined standard uncertainty; voltage -0.26 nV; voltage 0.54 nV; voltage 1.1 nV; voltage 1.48 nV; voltage 1.76 nV; voltage 10 V; NIST; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2010 Conference on

Conference_Location

Daejeon

Print_ISBN

978-1-4244-6795-2

Type

conf

DOI

10.1109/CPEM.2010.5543454

Filename

5543454