DocumentCode
3464284
Title
A reliability model for total field incidents
Author
Kerscher, William J., III ; Lin, Tony ; Stephenson, Hal ; Vannoy, E. Harold ; Wioskowski, Jerome
Author_Institution
Gen. Motors, Flint, MI, USA
fYear
1989
fDate
24-26 Jan 1989
Firstpage
22
Lastpage
28
Abstract
Traditional reliability predictions can differ significantly from actual field incident experience, particularly during the early life of the product. It is shown that it is possible to extend the reliability prediction process of preliminary electrical/electronic product designs, to include not only the effect of a constantly declining failure rate, but also the effects of infant mortality. The prediction can also account for misdiagnosis to predict warranty rate
Keywords
failure analysis; legislation; reliability; electrical product; electronic product; failure rate; infant mortality; misdiagnosis; reliability model; total field incidents; warranty rate; AC motors; Automotive electronics; Automotive engineering; Electronic equipment; Electronic equipment manufacture; Instruments; Predictive models; Product development; Vehicles; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1989. Proceedings., Annual
Conference_Location
Atlanta, GA
Type
conf
DOI
10.1109/ARMS.1989.49566
Filename
49566
Link To Document