• DocumentCode
    3464921
  • Title

    Radon-Like features and their application to connectomics

  • Author

    Kumar, Ritwik ; Vázquez-Reina, Amelio ; Pfister, Hanspeter

  • Author_Institution
    Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    186
  • Lastpage
    193
  • Abstract
    In this paper we present a novel class of so-called Radon-Like features, which allow for aggregation of spatially distributed image statistics into compact feature descriptors. Radon-Like features, which can be efficiently computed, lend themselves for use with both supervised and unsupervised learning methods. Here we describe various instantiations of these features and demonstrate there usefulness in context of neural connectivity analysis, i.e. Connectomics, in electron micrographs. Through various experiments on simulated as well as real data we establish the efficacy of the proposed features in various tasks like cell membrane enhancement, mitochondria segmentation, cell background segmentation, and vesicle cluster detection as compared to various other state-of-the-art techniques.
  • Keywords
    Radon transforms; biology computing; feature extraction; image segmentation; learning (artificial intelligence); neural nets; statistical analysis; cell background segmentation; cell membrane enhancement; connectomics applications; electron micrographs; feature descriptors; image statistics; mitochondria segmentation; neural connectivity analysis; radon like features; supervised learning methods; unsupervised learning methods; vesicle cluster detection; Application software; Brain; Cells (biology); Computational modeling; Computer science; Electron microscopy; Image segmentation; Neurons; Statistical distributions; Unsupervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543594
  • Filename
    5543594