• DocumentCode
    3465109
  • Title

    A taxonomy of face-models for system evaluation

  • Author

    Iyer, V.N. ; Kirkbride, S.R. ; Parks, B.C. ; Scheirer, W.J. ; Boult, T.E.

  • Author_Institution
    Univ. of Colorado, Colorado Springs, CO, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    63
  • Lastpage
    70
  • Abstract
    Generating statistically significant datasets for face matching system evaluation is a laborious and expensive process. Capturing variables such as atmospheric turbulence and other weather conditions especially with respect to face recognition at a distance exacerbate the problem further. It is even more difficult to work on system issues for long-range systems that impact the collection phase such as automated control loops for gain, focus or zoom, as they directly impact the collected data. And since system performance is confounded with variations in subject selection, pose, lighting, expression, etc., formal evaluation of second order effects are difficult without extremely large collections. This paper describes a taxonomy of face-models for controlled experimentation that overcome these challenges. We show that a gap has existed in experimental design and how a range of model-based approaches can partially fill that gap. Methods for generating 3D models that can be easily manipulated to create variations in pose are presented. Additionally described are techniques for validating and capturing model-based data for use in developing and testing outdoor long-range face matching systems.
  • Keywords
    face recognition; image matching; 3D model; atmospheric turbulence; automated control loop; face matching system evaluation; face model; face recognition; long range face matching system; model-based data; taxonomy; weather condition; Automatic control; Biometrics; Costs; Design for experiments; Face recognition; Springs; Statistics; System performance; Taxonomy; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543603
  • Filename
    5543603