DocumentCode
3466083
Title
Design and reliability considerations in implants
Author
Schaldach, M.
Author_Institution
Zentralinstitut fuer Biomed. Tech., Univ. of Erlangen, West Germany
fYear
1988
fDate
4-7 Nov. 1988
Firstpage
1235
Abstract
The author discusses a variety of failure mechanisms and their causes and delineates design guidelines that minimize their occurrence. He discusses passive components utilized in implantable hybrids, namely capacitors, resistors, and inductors. He examines the typical semiconductor characteristics and operating conditions required for implantable products, and describes bipolar and CMOS integrated circuits. The design of a sophisticated pacemaker hybrid is presented. Quality control issues are considered.<>
Keywords
biomedical electronics; prosthetics; CMOS integrated circuits; bipolar integrated circuits; capacitors; failure mechanisms; implant design; implantable hybrids; inductors; passive components; quality control; resistors; semiconductor characteristics; sophisticated pacemaker hybrid;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1988. Proceedings of the Annual International Conference of the IEEE
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-0785-2
Type
conf
DOI
10.1109/IEMBS.1988.94891
Filename
94891
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