DocumentCode
3466258
Title
Method for testing and characterization of analog-digital system
Author
Zagursky, V.
fYear
2001
fDate
2001
Firstpage
115
Lastpage
120
Abstract
The authors propose a method of testing of analog-digital systems (ADS). It is developed linear inertial heteroscedastic ADS model that takes account of nonlinear and inertial conversion effects. The validity of the model is verified by actual measurements of the dynamic responses of analog-digital converter (ADC)
Keywords
analogue-digital conversion; design for testability; electron device noise; frequency response; mixed analogue-digital integrated circuits; ADC testing; FFT; analog-digital systems; dynamic response; linear inertial heteroscedastic ADS model; mixed signal systems; Analog-digital conversion; Differential equations; Digital systems; Frequency response; Linear approximation; Manufacturing; Nonlinear dynamical systems; Signal processing; Signal to noise ratio; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location
Valley Forge, PA
ISSN
1080-7225
Print_ISBN
0-7803-7094-5
Type
conf
DOI
10.1109/AUTEST.2001.948925
Filename
948925
Link To Document