DocumentCode
3466389
Title
PIP-enhanced "at system" diagnosis on the flightline
Author
Orlidge, Leslie A.
Author_Institution
Honeywell Int., USA
fYear
2001
fDate
2001
Firstpage
168
Lastpage
178
Abstract
Flightline component false removals are costly and add to the logistics tail of every weapon system. Integrating portable maintenance aids (PMAs) and maintenance information systems into the test repertoire can help significantly; however, these solutions do little to augment the information available for failure diagnosis. Adding conventional test instrumentation under PMA control would provide the additional information we seek; however, these hardware intensive solutions are typically large, heavy and expensive. VXI offers an opportunity to consolidate instrumentation into a convenient package, however, the majority of VXI products provide a single function. Therefore many VXI modules are required to provide the needed functionality, resulting in an instrumentation package that is large and awkward to use at best, and quite often just not useable on the flightline. This paper addresses false removals, the challenges involved in addressing this issue, and solutions that are being implemented on the RAH-66 Comanche program. The PMA Instrument Pack (PIP) approach to flightline instrumentation facilitates powerful test techniques that augment diagnostic capability at the weapon system
Keywords
aerospace computing; aircraft instrumentation; aircraft maintenance; aircraft testing; automatic test equipment; fault diagnosis; helicopters; military aircraft; military computing; open systems; virtual instrumentation; weapons; ATE; MIL-PRF-28800; PIP enhanced at system diagnosis; PMA instrument pack; RAH-66 Comanche program; VXI modules; failure diagnosis; flightline component false removals; flightline instrumentation; intrusive testing; maintenance; nonintrusive testing; test techniques; virtual instruments; weapon system; Costs; Hardware; Instruments; Logistics; Packaging; Personnel; Pipelines; System testing; Tail; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location
Valley Forge, PA
ISSN
1080-7225
Print_ISBN
0-7803-7094-5
Type
conf
DOI
10.1109/AUTEST.2001.948962
Filename
948962
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