Improved dual Josephson voltage standard potentiometer for high precision arbitrary resistance ratio measurements

Author

Beug, M.F. ; Palafox, L. ; Behr, R.

Author_Institution

Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany

fYear

2010

fDate

13-18 June 2010

Firstpage

611

Lastpage

612

Abstract

This work presents an improved and much more flexible setup of the dual Josephson voltage standard potentiometer. It can be used for high precision arbitrary resistance ratio measurements. For this purpose a 18 channel DAC based current source was developed to control all segments of binary divided 1-V Josephson voltage standard arrays. Additionally different types of current sources to generate the measurement current are built up to test the influence of current noise on the measurement uncertainly. First test measurements on two thermally controlled 12.9 kΩ resistors revealed resistance ratio measurement uncertainties in the 10^-9 range.

Keywords

digital-analogue conversion; electric resistance measurement; measurement standards; measurement uncertainty; potentiometers; voltage measurement; DAC based current source; binary divided Josephson voltage standard arrays; current noise; high precision arbitrary resistance ratio measurements; improved dual Josephson voltage standard potentiometer; measurement uncertainly; test measurements; thermal controlled resistor; voltage 1 V; Current measurement; Electrical resistance measurement; Measurement standards; Measurement uncertainty; Noise measurement; Potentiometers; Standards development; Testing; Thermal resistance; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2010 Conference on

Conference_Location

Daejeon

Print_ISBN

978-1-4244-6795-2

Type

conf

DOI

10.1109/CPEM.2010.5543762

Filename

5543762