DocumentCode
3468070
Title
Radiation effects in a fixed-point digital signal processor
Author
Crain, S.H. ; Velazco, R. ; Alvarez, M.T. ; Bofill, A. ; Yu, P. ; Koga, R.
Author_Institution
Aerosp. Corp., Los Angeles, CA, USA
fYear
1999
fDate
1999
Firstpage
30
Lastpage
34
Abstract
Radiation effects in a fixed-point digital signal processor (DSP) from Texas Instruments were studied. Single event upset, single event snapback and total ionizing dose effects were observed and some comparisons to other studies of floating-point DSPs are made
Keywords
digital signal processing chips; fixed point arithmetic; integrated circuit testing; radiation hardening (electronics); DSP; Texas Instruments; fixed-point digital signal processor; floating-point DSPs; radiation effects; single event snapback; single event upset; testing; total ionizing dose effects; Aerospace testing; Circuit testing; Digital signal processing; Digital signal processors; Instruments; Integrated circuit testing; Laboratories; Particle beam measurements; Radiation effects; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1999
Conference_Location
Norfolk, VA
Print_ISBN
0-7803-5660-8
Type
conf
DOI
10.1109/REDW.1999.816053
Filename
816053
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