DocumentCode
3468243
Title
Radiation evaluation of plastic encapsulated transistors and microcircuits for use in space applications
Author
Gorelick, J.L. ; McClure, S.S. ; Swink, C.
Author_Institution
Hughes Space & Commun. Co., Los Angeles, CA, USA
fYear
1999
fDate
1999
Firstpage
102
Lastpage
107
Abstract
Radiation test results demonstrate the viability of selected PEMs devices for space use. The majority of the devices selected for evaluation are commercial equivalents of devices currently used on a number of satellites. Materials evaluations and charging experiments were also performed
Keywords
bipolar transistors; encapsulation; integrated circuit testing; radiation hardening (electronics); semiconductor device testing; space vehicle electronics; plastic encapsulated microcircuit; plastic encapsulated transistor; radiation testing; space electronics; Ceramics; Circuit testing; Degradation; Integrated circuit testing; Manufacturing; Materials testing; Operational amplifiers; Plastic integrated circuit packaging; Plastic packaging; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1999
Conference_Location
Norfolk, VA
Print_ISBN
0-7803-5660-8
Type
conf
DOI
10.1109/REDW.1999.816063
Filename
816063
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