• DocumentCode
    3468506
  • Title

    Modeling and electrostatic focusing for a field emission electron source

  • Author

    Jabotinski, Vadim ; Pasour, John ; Nguyen, Khanh T. ; Petillo, John ; Levush, Baruch ; Abe, D.

  • Author_Institution
    Vacuum Electron. Branch, U.S. Naval Res. Lab., Washington, DC, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents theory and analysis of single-tip field emission and electron beam propagation in the electrostatic focusing fields. It is shown that two gate apertures with a focusing anode allow transport of narrow electron beams over long distances without need for a confining magnetic field. Physical mechanisms of the beam formation, transport, field emission energy distributions, the effects of the emission properties, and parametric studies are discussed, emission current formula is derived, and new concept and model of the bandgap-spread multilevel field emission is given.
  • Keywords
    electron beam focusing; electron sources; electrostatics; field emission; bandgap-spread multilevel field emission; beam formation; beam transport; electron beam propagation; electrostatic focusing fields; emission current formula; emission properties; field emission electron source; field emission energy distributions; focusing anode; gate apertures; narrow electron beams; parametric studies; physical mechanisms; single-tip field emission; Anodes; Current density; Electric fields; Electron beams; Focusing; Geometry; Logic gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference (PPC), 2013 19th IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2158-4915
  • Type

    conf

  • DOI
    10.1109/PPC.2013.6627571
  • Filename
    6627571