DocumentCode
3469919
Title
Improvements in reliability assessment and prediction methodology
Author
Johnson, Bruce G. ; Gullo, Lou
Author_Institution
Dept. of Commercial Aviation Syst.-Sensor Products Operations, Honeywell Inc., Minneapolis, MN, USA
fYear
2000
fDate
2000
Firstpage
181
Lastpage
187
Abstract
This paper describes the continuing evolution of Honeywell´s HIRAP, Honeywell In-Service Reliability Assessment Program. The approaches used in HIRAP remain consistent with industry efforts in the area of reliability assessment. The paper also presents a description of the process flows, showing simplifications that have occurred in the process over the last year. Unlike conventional reliability prediction methodologies, which focus solely on part failure rates, the methodologies presented here incorporate design failure rates, manufacturing process failure rates and other causes for equipment removal
Keywords
failure analysis; manufacturing processes; reliability; HIRAP; Honeywell In-Service Reliability Assessment Program; design failure rate; equipment removal causes; manufacturing process failure rate; methodology improvements; part failure rate; process flows; reliability assessment; reliability prediction; Airplanes; Application specific integrated circuits; Circuit testing; Defense industry; Failure analysis; Integrated circuit reliability; Life estimation; Maintenance; Manufacturing industries; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2000. Proceedings. Annual
Conference_Location
Los Angeles, CA
ISSN
0149-144X
Print_ISBN
0-7803-5848-1
Type
conf
DOI
10.1109/RAMS.2000.816304
Filename
816304
Link To Document