• DocumentCode
    3469919
  • Title

    Improvements in reliability assessment and prediction methodology

  • Author

    Johnson, Bruce G. ; Gullo, Lou

  • Author_Institution
    Dept. of Commercial Aviation Syst.-Sensor Products Operations, Honeywell Inc., Minneapolis, MN, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    181
  • Lastpage
    187
  • Abstract
    This paper describes the continuing evolution of Honeywell´s HIRAP, Honeywell In-Service Reliability Assessment Program. The approaches used in HIRAP remain consistent with industry efforts in the area of reliability assessment. The paper also presents a description of the process flows, showing simplifications that have occurred in the process over the last year. Unlike conventional reliability prediction methodologies, which focus solely on part failure rates, the methodologies presented here incorporate design failure rates, manufacturing process failure rates and other causes for equipment removal
  • Keywords
    failure analysis; manufacturing processes; reliability; HIRAP; Honeywell In-Service Reliability Assessment Program; design failure rate; equipment removal causes; manufacturing process failure rate; methodology improvements; part failure rate; process flows; reliability assessment; reliability prediction; Airplanes; Application specific integrated circuits; Circuit testing; Defense industry; Failure analysis; Integrated circuit reliability; Life estimation; Maintenance; Manufacturing industries; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2000. Proceedings. Annual
  • Conference_Location
    Los Angeles, CA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-5848-1
  • Type

    conf

  • DOI
    10.1109/RAMS.2000.816304
  • Filename
    816304