• DocumentCode
    3469947
  • Title

    Particle detection in vacuum interrupter after current interruption

  • Author

    Shuo Xu ; Hidaka, K. ; Kumada, A. ; Ikeda, Hinata ; Kaneko, Eiji

  • Author_Institution
    Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    After high current interruption in vacuum interrupter, the electrode temperature rises because of the current heat process, and the surface becomes rough due to the arc burn on electrodes. In this paper, random discharge after current zero is reported, and conducting particle is considered to be responsible for the phenomenon. The authors developed a synthetic experiment system, which is a combination of current and voltage sources. High voltage is applied to the interrupter after current interruption. The arc current can be adjusted up to 10kA and the voltage can reach as high as 50kV under AC condition. The particle detection optical system consists of a laser and a diffraction imaging system. A high speed video camera is used to record the diffraction image induced by the small particle in the inter-electrode space. Using this system, the dynamics of small particles is tracked. The speed and size of the particle is measured and the charge quantity of small particles is derived from the dynamics.
  • Keywords
    cameras; electrodes; vacuum interrupters; charge quantity; conducting particle; current 10 kA; current interruption; current sources; diffraction image; diffraction imaging system; electrode temperature; heat process; high speed video camera; inter-electrode space; nonsustained disruptive discharge; particle detection; particle detection optical system; random discharge; synthetic experiment system; vacuum interrupter; voltage 50 kV; voltage sources; Cameras; Cathodes; Circuit breakers; Discharges (electric); Interrupters; Vacuum arcs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference (PPC), 2013 19th IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2158-4915
  • Type

    conf

  • DOI
    10.1109/PPC.2013.6627650
  • Filename
    6627650