• DocumentCode
    3469985
  • Title

    Study of Fab tool waste drain separation and reduction application in Bump process

  • Author

    Liu, K.C. ; Chang, C.N. ; Chen, W.M. ; Lan, J.K. ; Lien, Tony ; Lu, Jun ; Wei-Jen Huang ; Tseng, E. ; Tu, C.J. ; Lai, L.

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
  • fYear
    2013
  • fDate
    6-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    All chemical reduction were achieved by Background study of chemicals used and discharged behavior in Fab tools, Waste drain concentration analysis, Fab tools adjustment of the PM procedure, Cu free etching chemical replacement, Theoretical waste vs. Actual waste, Waste separation based on recycling criteria to meet the maximum benefit, Total 75% waste chemical to be reduced effectively.
  • Keywords
    etching; recycling; semiconductor industry; separation; waste disposal; Fab tool waste drain reduction; Fab tool waste drain separation; bump process; chemical reduction; copper free etching chemical replacement; recycling criteria; semiconductor industry; tools adjustment; waste chemical; waste drain concentration analysis; waste separation; Chemicals; Hafnium; Joints; Lead; Maintenance engineering; Nickel; Recycling; Bump process; Reduction; Waste drain; separation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    e-Manufacturing & Design Collaboration Symposium (eMDC), 2013
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/eMDC.2013.6756060
  • Filename
    6756060