[Title page]

fYear

2009

fDate

4-7 Oct. 2009

Firstpage

1

Lastpage

1

Abstract

The following topics are dealt with: disruptive computing technology; system power; thermal issues; timing analysis; optimization; hierarchical testing; design for test; synchronization; interconnects; clocking; energy efficient architectures; system level verification; system level testing; reliability; advanced memory; high performance architecture; processors; fault detection; logic design; memory design; application-optimized design; low voltage electronics; low power electronics; and cell layout.

Keywords

design for testability; formal verification; logic design; logic testing; low-power electronics; memory architecture; microprocessor chips; multiprocessor interconnection networks; optimisation; power aware computing; reliability; synchronisation; timing; advanced memory; application-optimized design; cell layout; clocking; design for test; disruptive computing technology; energy efficient architectures; fault detection; hierarchical testing; high performance architecture; interconnects; logic design; low power electronics; low voltage electronics; memory design; optimization; processors; reliability; synchronization; system level testing; system level verification; system power; thermal issues; timing analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design, 2009. ICCD 2009. IEEE International Conference on

Conference_Location

Lake Tahoe, CA

ISSN

1063-6404

Print_ISBN

978-1-4244-5029-9

Type

conf

DOI

10.1109/ICCD.2009.5413190

Filename

5413190