• DocumentCode
    3470032
  • Title

    A 4-level storage 4 Gb DRAM

  • Author

    Murotani, T. ; Naritake, I. ; Matano, T. ; Ohtsuki, T. ; Kasai, N. ; Koga, H. ; Koyama, K. ; Nakajima, K. ; Yamaguchi, H. ; Watanabe, H. ; Okuda, T.

  • Author_Institution
    NEC Corp., Kanagawa, Japan
  • fYear
    1997
  • fDate
    8-8 Feb. 1997
  • Firstpage
    74
  • Lastpage
    75
  • Abstract
    Bit-cost reduction is one of the most serious issues for file application DRAMs. Chip size reduction or density increase has been an effective solution. Lithographic technology has permitted this density increase through 70% reduction in the minimum design rule for each subsequent DRAM generation. However, for further density increase, another memory cell reduction technology is needed. Multi-level storage is one circuit technology that can reduce the effective cell size since it allows the storage of multiple voltage levels in a single memory cell functioning as a multi-bit memory. When four levels are stored in a single memory cell, the effective cell size is halved. The authors show that a charge-coupling sense amplifier, charge-sharing restore, and time-shared sensing increase speed and reduce sense-circuit area for 4 Gb DRAM.
  • Keywords
    CMOS memory circuits; DRAM chips; 0.15 micron; 1 Gbit; 4-level storage DRAM; bit-cost reduction; cell size reduction; charge-coupling sense amplifier; charge-sharing restore; chip size reduction; file application DRAMs; multi-level storage; time-shared sensing; Binary search trees; Capacitance; Capacitors; Circuits; Dielectric materials; National electric code; Random access memory; Signal restoration; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1997. Digest of Technical Papers. 43rd ISSCC., 1997 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0193-6530
  • Print_ISBN
    0-7803-3721-2
  • Type

    conf

  • DOI
    10.1109/ISSCC.1997.585267
  • Filename
    585267