DocumentCode
3470032
Title
A 4-level storage 4 Gb DRAM
Author
Murotani, T. ; Naritake, I. ; Matano, T. ; Ohtsuki, T. ; Kasai, N. ; Koga, H. ; Koyama, K. ; Nakajima, K. ; Yamaguchi, H. ; Watanabe, H. ; Okuda, T.
Author_Institution
NEC Corp., Kanagawa, Japan
fYear
1997
fDate
8-8 Feb. 1997
Firstpage
74
Lastpage
75
Abstract
Bit-cost reduction is one of the most serious issues for file application DRAMs. Chip size reduction or density increase has been an effective solution. Lithographic technology has permitted this density increase through 70% reduction in the minimum design rule for each subsequent DRAM generation. However, for further density increase, another memory cell reduction technology is needed. Multi-level storage is one circuit technology that can reduce the effective cell size since it allows the storage of multiple voltage levels in a single memory cell functioning as a multi-bit memory. When four levels are stored in a single memory cell, the effective cell size is halved. The authors show that a charge-coupling sense amplifier, charge-sharing restore, and time-shared sensing increase speed and reduce sense-circuit area for 4 Gb DRAM.
Keywords
CMOS memory circuits; DRAM chips; 0.15 micron; 1 Gbit; 4-level storage DRAM; bit-cost reduction; cell size reduction; charge-coupling sense amplifier; charge-sharing restore; chip size reduction; file application DRAMs; multi-level storage; time-shared sensing; Binary search trees; Capacitance; Capacitors; Circuits; Dielectric materials; National electric code; Random access memory; Signal restoration; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1997. Digest of Technical Papers. 43rd ISSCC., 1997 IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
0193-6530
Print_ISBN
0-7803-3721-2
Type
conf
DOI
10.1109/ISSCC.1997.585267
Filename
585267
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