• DocumentCode
    3472555
  • Title

    Challenges for RF SOC in nanometer technology

  • Author

    Yen, Albert

  • Author_Institution
    UMC Corp., Sunnyvale, CA
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    1829
  • Lastpage
    1832
  • Abstract
    This paper discusses the challenges, and issues that RF SOC facing regarding architecture, manufacture and design. To meet the challenge, silicon foundries have to provide more beyond design kits and manufacture services. The close cooperative of advanced semiconductor technology, design service, and advances in electronic design automation (EDA) becomes the solution for the new era. It is shown that novel improvements to the foundry design kits and utilization of advanced electromagnetic and circuit simulation is the key to first-pass silicon success
  • Keywords
    circuit simulation; electronic design automation; semiconductor technology; system-on-chip; RF SOC; advanced semiconductor technology; circuit simulation; electromagnetic simulation; electronic design automation; nanometer technology; Circuits; Computer architecture; Cost function; Electronic design automation and methodology; Foundries; Packaging; Radio frequency; Semiconductor device manufacture; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306459
  • Filename
    4098555