DocumentCode
3472555
Title
Challenges for RF SOC in nanometer technology
Author
Yen, Albert
Author_Institution
UMC Corp., Sunnyvale, CA
fYear
2006
fDate
23-26 Oct. 2006
Firstpage
1829
Lastpage
1832
Abstract
This paper discusses the challenges, and issues that RF SOC facing regarding architecture, manufacture and design. To meet the challenge, silicon foundries have to provide more beyond design kits and manufacture services. The close cooperative of advanced semiconductor technology, design service, and advances in electronic design automation (EDA) becomes the solution for the new era. It is shown that novel improvements to the foundry design kits and utilization of advanced electromagnetic and circuit simulation is the key to first-pass silicon success
Keywords
circuit simulation; electronic design automation; semiconductor technology; system-on-chip; RF SOC; advanced semiconductor technology; circuit simulation; electromagnetic simulation; electronic design automation; nanometer technology; Circuits; Computer architecture; Cost function; Electronic design automation and methodology; Foundries; Packaging; Radio frequency; Semiconductor device manufacture; Silicon; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0160-7
Electronic_ISBN
1-4244-0161-5
Type
conf
DOI
10.1109/ICSICT.2006.306459
Filename
4098555
Link To Document