DocumentCode
3473962
Title
Open architecture tester - What is a key issue of OAT?
Author
Nishimura, Y.
Author_Institution
Renesas Technology Corp.
fYear
2004
fDate
27-30 Jan. 2004
Firstpage
336
Lastpage
336
Abstract
This paper summarizes an outline of OAT(0pen Architecture Tester), and a positioning of OAT in an LSI manufacturing process is clarified. A mass-production test can be prepared synchronizing with the next SoC generation development & production by the OAT introduction. The panel will be disrussed the key issues required in order to make this advantage of the OAT.
Keywords
Computer architecture; Electronic mail; Hardware; Large scale integration; Management training; Manufacturing processes; Production; Publishing; Semiconductor device testing; Software performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location
Yohohama, Japan
Print_ISBN
0-7803-8175-0
Type
conf
DOI
10.1109/ASPDAC.2004.1337593
Filename
1337593
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