• DocumentCode
    3474337
  • Title

    Model checking on state transition diagram

  • Author

    Das, Batsayan ; Sarkar, Dipankar ; Chattopadhyay, Santanu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
  • fYear
    2004
  • fDate
    27-30 Jan. 2004
  • Firstpage
    412
  • Lastpage
    417
  • Abstract
    Computation tree logic (CTL) model checking is sensitive to state explosion. Conventionally, CTL semantics is defined over Kripke structure where each state is labelled with all the atomic propositions. For open systems, this necessitates input labeling of the states. In contrast, the common model, which is used for sequential circuit design, is the finite state machine (FSM) model, or equivalently, the state transition diagram (STD), where the inputs are associated not with the states but with the transitions. Thus, to use a conventional CTL model checker, the STD has to be converted first to the Kripke structure and then applying the model checking algorithm on the Kripke structure. The need for associating input labels to the states results in state explosion which finally tells upon the model checking efficiency. We present the CTL semantics over STD structures and develops a model checking algorithm which works directly over the STD. A performance gain over conventional model checking by an exponential factor results in the process, especially for open systems.
  • Keywords
    computational complexity; computational linguistics; finite state machines; formal verification; logic testing; sequential circuits; CTL model checking; CTL semantic; Kripke structure; computation tree logic; finite state machine; open system; sequential circuit design; state transition diagram; Automata; Bellows; Electronic mail; Explosions; Labeling; Logic; Open systems; Performance gain; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
  • Print_ISBN
    0-7803-8175-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2004.1337610
  • Filename
    1337610