• DocumentCode
    347666
  • Title

    A method to improve the performance of high-speed waveform digitizing

  • Author

    Asami, Koji ; Tajiri, Shinsuke

  • Author_Institution
    Advantest Corp., Gunma, Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    947
  • Lastpage
    954
  • Abstract
    One method for achieving high-speed waveform digitizing uses time-interleaved Analog-to-Digital Converters (ADC´s). Time interleaving with two or more ADC´s enables waveform digitizing at sampling rates proportionately faster than when using just one ADC. A well-known drawback of this method is that the misalignment of sampling instances degrades the achievable dynamic range. This paper proposes a solution that removes distortion caused by the alignment error with digital signal processing. Since the algorithm is realized as an extension to the ordinary FFT, the objective is achieved without significant loss of throughput
  • Keywords
    analogue-digital conversion; discrete Fourier transforms; error compensation; integrated circuit testing; signal sampling; waveform analysis; FFT extension; achievable dynamic range; digital signal processing; discrete FT; error compensation; high-speed waveform digitizing; mixed signal testers; performance improvement; quantization; time alignment error; time-interleaved ADC; waveform sampling rate; Analog-digital conversion; Clocks; Degradation; Frequency domain analysis; Interleaved codes; Quantization; Sampling methods; Signal processing algorithms; Signal sampling; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805827
  • Filename
    805827