• DocumentCode
    3476788
  • Title

    Statistical guarantees of performance for MIMO designs

  • Author

    Kumar, J. Ayanand Asok ; Vasudevan, Shobha

  • Author_Institution
    Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    467
  • Lastpage
    476
  • Abstract
    Sources of noise such as quantization, introduce randomness into Register Transfer Level (RTL) designs of Multiple Input Multiple Output (MIMO) systems. Performance of these MIMO RTL designs is typically quantified by metrics averaged over simulations. In this paper, we introduce a formal approach to compute these metrics with high confidence. We define best, bounded and average case performance metrics as properties in a probabilistic temporal logic. We then use probabilistic model checking to verify these properties for MIMO RTL and thereby guarantee the statistical performance. If a property fails, we show a characterization of error. However, probabilistic model checking is known to encounter the problem of state space explosion. With respect to the properties of interest, we show sound and efficient reductions that significantly improve the scalability of our approach. We illustrate our approach on different non-trivial components of MIMO system designs.
  • Keywords
    MIMO communication; integrated circuit design; logic design; performance evaluation; probabilistic logic; temporal logic; MIMO RTL design; case performance metric; error characterization; multiple input multiple output system; noise source; probabilistic model checking; probabilistic temporal logic; register transfer level; state space explosion; Acoustic noise; Computational modeling; Explosions; MIMO; Measurement; Noise level; Probabilistic logic; Quantization; Registers; State-space methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544281
  • Filename
    5544281