• DocumentCode
    3477018
  • Title

    Exploiting diverse observation perspectives to get insights on the malware landscape

  • Author

    Leita, Corrado ; Bayer, Ulrich ; Kirda, Engin

  • Author_Institution
    Symantec Res. Labs., Sophia Antipolis, France
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    393
  • Lastpage
    402
  • Abstract
    We are witnessing an increasing complexity in the malware analysis scenario. The usage of polymorphic techniques generates a new challenge: it is often difficult to discern the instance of a known polymorphic malware from that of a newly encountered malware family, and to evaluate the impact of patching and code sharing among malware writers in order to prioritize analysis efforts. This paper offers an empirical study on the value of exploiting the complementarity of different information sources in studying malware relationships. By leveraging real-world data generated by a distributed honeypot deployment, we combine clustering techniques based on static and behavioral characteristics of the samples, and we show how this combination helps in detecting clustering anomalies. We also show how the different characteristics of the approaches can help, once combined, to underline relationships among different code variants. Finally, we highlight the importance of contextual information on malware propagation for getting a deeper understanding of the evolution and the “economy” of the different threats.
  • Keywords
    invasive software; pattern clustering; clustering anomaly detection; clustering techniques; code sharing impact; distributed honeypot deployment; malware analysis scenario; malware landscape; malware propagation; malware relationships; patching impact; polymorphic techniques; Character generation; Computer crime; Computer worms; Control systems; Engines; Explosions; Internet; Marine vehicles; Protocols; Security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544291
  • Filename
    5544291