• DocumentCode
    3477511
  • Title

    Predictive modeling and experimental validation of lead-free solder joint reliability under temperature cycling

  • Author

    Chan, Y.S. ; Song, F. ; Lo, C. C Jeffery ; Lee, Eddie ; Lee, S. W Ricky

  • Author_Institution
    Center for Adv. Microsyst. Packaging, Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • fYear
    2010
  • fDate
    12-14 Jan. 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This study serves to validate the predictive finite element modeling approach for the solder joint thermal fatigue life analysis, with emphasis on the applicability to various lead-free solder joints. The three packages involved in the study are 8×8 mm PBGA, l0×l0 mm QFN, and 51×51 mm CBGA. They are designed to consist of SAC387, SAC305, ¿SAC305 ball + SAC387 paste¿ and ¿SAC387 ball + SAC305 paste¿ solder joints. ATC tests are performed to determine the characteristic lives of these packages. On the other hand, finite element models are developed for these test vehicles. They serve to evaluate the damage of each package, as represented by the creep strain or the creep strain energy density, accumulated during the ATC test. As demonstrated from this work, the commonly adopted power law correlation, which links the numerically calculated damage parameters with the experimentally determined characteristic lives, can be used for the solder joint thermal fatigue life prediction, even for the case with mixed solder alloys.
  • Keywords
    ball grid arrays; ceramic packaging; couplings; creep; finite element analysis; life testing; reliability; solders; temperature; thermal management (packaging); thermal stress cracking; ATC test; CBGA package; PBGA package; accelerated temperature cycling; ceramic ball grid array; creep strain energy density; damage parameter; finite element modeling; lead-free solder joint reliability; plastic ball grid array; power law correlation; predictive modeling; solder alloy; thermal fatigue life analysis; Creep; Environmentally friendly manufacturing techniques; Fatigue; Finite element methods; Lead; Packaging; Predictive models; Soldering; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and Health Management Conference, 2010. PHM '10.
  • Conference_Location
    Macao
  • Print_ISBN
    978-1-4244-4756-5
  • Electronic_ISBN
    978-1-4244-4758-9
  • Type

    conf

  • DOI
    10.1109/PHM.2010.5413586
  • Filename
    5413586