• DocumentCode
    3477659
  • Title

    Measuring Area-Complexity Using Boolean Difference

  • Author

    Kagliwal, A. ; Balachandran, Shankar

  • Author_Institution
    Comput. Sci. & Eng. Dept., Indian Inst. of Technol. Madras, Chennai, India
  • fYear
    2013
  • fDate
    5-10 Jan. 2013
  • Firstpage
    245
  • Lastpage
    250
  • Abstract
    For a combinational circuit, area-complexity is a measure that estimates the logic area of the circuit without mapping to logic gates. Several measures like literal count, number of primary input/outputs, etc. have been used in the past as area-complexity metrics. In this paper, we propose a novel area-complexity measure using the theory of Boolean difference and Taylor expansion for Boolean functions. We demonstrate how to capture the area-complexity of a Boolean function using the complexity of its Boolean derivatives. We evaluate the metric on circuits from MCNC benchmark suite and a sizeable collection of randomly generated circuits. We compare our metric with existing techniques based on literal-count and BDD properties. We show that the new area-complexity measure is accurate within 10% of the actual number of gates synthesized using ABC as opposed to at least 100% and 15% for the metrics based on literal-count and BDD properties respectively. We also show the robustness of our metric across three different gate-libraries.
  • Keywords
    Boolean functions; area measurement; circuit complexity; combinational circuits; logic design; ABC; BDD properties; Boolean derivatives; Boolean difference; Boolean functions; MCNC benchmark suite; Taylor expansion; area-complexity measurement; combinational circuit; gate synthesis; gate-libraries; literal-count-based techniques; logic area estimation; primary input-outputs; randomly generated circuits; Area measurement; Benchmark testing; Boolean functions; Complexity theory; Logic gates; Taylor series; Boolean difference; area-complexity; logic synthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and 2013 12th International Conference on Embedded Systems (VLSID), 2013 26th International Conference on
  • Conference_Location
    Pune
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-4673-4639-9
  • Type

    conf

  • DOI
    10.1109/VLSID.2013.195
  • Filename
    6472647