DocumentCode
3477997
Title
Study of viscoelastic effect of EMC on FBGA block warpage by FEA simulation
Author
Lin Tan ; Jinrui Li ; Xiyun Cheng ; Qian Wang ; Jian Cai ; Haijun Shen ; Guoliang Yu ; Tonglong Zhang ; Shuidi Wang
Author_Institution
Inst. of Microelectron., Tsinghua Univ., Beijing, China
fYear
2013
fDate
11-14 Aug. 2013
Firstpage
343
Lastpage
346
Abstract
Epoxy Molding Compound (EMC) is the encapsulation material that can provide mechanical support and protection to IC packages. In the meantime, it is also a key contributor to package warpage. Finite element analysis (FEA) has been widely used in packaging development to improve product performance more efficiently. EMC is usually modeled as piecewise linear elastic material in FEA model for simplification. However, EMC has viscoelastic properties like other thermosetting materials. During molding and post mold cure (PMC) processes EMC will undergo polymerization conversion and chemical aging that will change its constitutive behavior and hence affect package warpage. In this paper, block warpage of an FBGA (Fine-Pitch Ball Grid Array) package induced by molding and PMC processes was simulated using FEA method by considering viscoelastic effect of EMC. Results showed that chemical shrinkage of EMC can offset effect of thermal shrinkage on block warpage significantly; and PMC process also helped reduce warpage magnitude by a considerable proportion. To verify the simulation results, experiments had been performed to measure the FBGA block warpage after molding and PMC processes. Comparison showed the FEA prediction had good agreement with actual warpage measurement data.
Keywords
ball grid arrays; encapsulation; finite element analysis; integrated circuit packaging; moulding; polymerisation; viscoelasticity; EMC; FBGA block warpage; FEA simulation; IC packages; chemical aging; chemical shrinkage; encapsulation material; epoxy molding compound; fine pitch ball grid array package; finite element analysis; mechanical support; piecewise linear elastic material; polymerization conversion; post mold cure; thermosetting materials; viscoelastic effect; viscoelastic properties; Chemicals; Electromagnetic compatibility; Electronics packaging; Integrated circuit modeling; Materials; Packaging; Simulation; Epoxy Molding Compound (EMC); Finite Element Analysis (FEA); Viscoelasticity; Warpage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location
Dalian
Type
conf
DOI
10.1109/ICEPT.2013.6756485
Filename
6756485
Link To Document