• DocumentCode
    3478087
  • Title

    A Low Power Fault Tolerant Reversible Decoder Using MOS Transistors

  • Author

    Shamsujjoha, M. ; Babu, Hafiz Md Hasan

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of Dhaka, Dhaka, Bangladesh
  • fYear
    2013
  • fDate
    5-10 Jan. 2013
  • Firstpage
    368
  • Lastpage
    373
  • Abstract
    This paper demonstrates the reversible logic synthesis for the n-to-2n decoder, where n is the number of data bits. The circuits are designed using only reversible fault tolerant Fredkin and Feynman double gates. Thus, the entire scheme inherently becomes fault tolerant. Algorithm for designing the generalized decoder has been presented. In addition, several lower bounds on the number of constant inputs, garbage outputs and quantum cost of the reversible fault tolerant decoder have been proposed. Transistor simulations of the proposed decoder are shown using standard p-MOS 901 and n-MOS 902 model with delay of 0.030 ns and 0.12 m channel length, which proved the functional correctness of the proposed circuits. The comparative results show that the proposed design is much better in terms of quantum cost, delay, hardware complexity and has significantly better scalability than the existing approach.
  • Keywords
    MOSFET; fault tolerance; logic gates; low-power electronics; Feynman double gates; Fredkin double gates; MOS transistors; delay; hardware complexity; low power fault tolerant reversible decoder; n-to-2n decoder; quantum cost; reversible fault tolerant decoder; reversible logic synthesis; standard n-MOS 902 model; standard p-MOS 901 model; transistor simulations; Complexity theory; Decoding; Fault tolerance; Fault tolerant systems; Hardware; Logic gates; Vectors; Decoder; Delay; Garbage Output; Low Power Design; Quantum Cost; Reversible & Fault Tolerant Computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and 2013 12th International Conference on Embedded Systems (VLSID), 2013 26th International Conference on
  • Conference_Location
    Pune
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-4673-4639-9
  • Type

    conf

  • DOI
    10.1109/VLSID.2013.216
  • Filename
    6472668