• DocumentCode
    3479930
  • Title

    An Automatic Temperature Compensation Of Internal Sense Ground For Sub-quarter Micron Drams

  • Author

    Ooishi, T. ; Hamade, K. ; Asakura, M. ; Yasuda, K. ; Hidaka, H. ; Miyamoto, H. ; Ozaki, H.

  • Author_Institution
    Ulsi Laboratory, Mitsubishi Electric Corporation, Itami, Japan
  • fYear
    1994
  • fDate
    9-11 June 1994
  • Firstpage
    77
  • Lastpage
    78
  • Keywords
    Circuits; Laboratories; Land surface temperature; Leakage current; Random access memory; Temperature dependence; Temperature distribution; Temperature sensors; Threshold voltage; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1994. Digest of Technical Papers., 1994 Symposium on
  • Conference_Location
    Honolulu, HI, USA
  • Print_ISBN
    0-7803-1918-4
  • Type

    conf

  • DOI
    10.1109/VLSIC.1994.586224
  • Filename
    586224
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3479930