DocumentCode
3480011
Title
Study on moisture-induced corrosion mechanism of copper wire bonding by thermodynamic calculation
Author
Yingzhi Zeng ; Kewu Bai ; Hongmei Jin
Author_Institution
Inst. of High Performance Comput., Agency for Sci., Singapore, Singapore
fYear
2013
fDate
11-14 Aug. 2013
Firstpage
777
Lastpage
780
Abstract
Understanding the moisture-induced corrosion mechanism of copper wire bonding is crucial for achieving longer life reliability of copper bonding. While the formation of Al-Cu intermetallic compound (IMC) is found to dominate the bond reliability, the mechanism remains unclear despite considerable efforts by experiments. Pourbaix (Eh-pH) diagrams have long been used to evaluate the theoretical activity of a given metal or alloy in a corrosion situation. However, the Eh-pH diagram of Cu-Al alloy in bonding condition is lack. In this work, by assessing various thermodynamic data of Cu-Al-Cl-H2O, we construct the Pourbaix diagrams associated with Cu bonding involving IMCs and study the corrosion behaviors under various environmental parameters such as temperatures and chloride concentrations. The results yield greater insight into the corrosion mechanism which may lead to improving reliability of Cu bonding.
Keywords
aluminium alloys; chlorine; copper alloys; corrosion resistance; lead bonding; moisture; reliability; water; Al-Cu; Al-Cu IMC; Al-Cu intermetallic compound; Cu bonding reliability; Cu-Al alloy; Cu-Al-Cl-H2O; Eh-pH diagrams; Pourbaix diagrams; bond reliability; chloride concentrations; copper wire bonding; longer life reliability; moisture-induced corrosion mechanism; Bonding; Compounds; Copper; Corrosion; Reliability; Thermodynamics; Wires; Pourbaix diagram; bonding; copper; intermetallics; modeling; passivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location
Dalian
Type
conf
DOI
10.1109/ICEPT.2013.6756580
Filename
6756580
Link To Document