DocumentCode
3481700
Title
Modification of silicon surface by direct laser interference
Author
Dapeng Wang ; Zuobin Wang ; Ziang Zhang ; Yong Yue ; Dayou Li ; Maple, Carsten
Author_Institution
JR3CN, Changchun Univ. of Sci. & Technol., Changchun, China
fYear
2012
fDate
Aug. 29 2012-Sept. 1 2012
Firstpage
5
Lastpage
8
Abstract
Periodic and quasi-periodic structures on silicon surface have numerous significant applications in photoelectronics and surface engineering. A number of technologies have been developed to fabricate these structures in various research areas. In this work, we take the strategy of direct nanosecond laser interference patterning technology. Well-defined grating and dot structures have been achieved and interactive thermal effect was observed obviously. Additionally, the height and width of different structures were analyzed by AFM. It can be demonstrated that direct laser interference lithography is a promising technology which has the capability for the manufacturing of micro and nano structures.
Keywords
atomic force microscopy; elemental semiconductors; laser materials processing; photolithography; silicon; surface structure; surface treatment; AFM; Si; direct laser interference lithography; direct nanosecond laser interference patterning technology; dot structures; grating structure; interactive thermal effect; microstructures; nanostructures; quasiperiodic structure; silicon surface modification; Gratings; Interference; Laser beams; Laser theory; Measurement by laser beam; Silicon; Direct laser interference patterning; micro and nano structures; thermal effect;
fLanguage
English
Publisher
ieee
Conference_Titel
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location
Shaanxi
Print_ISBN
978-1-4673-4588-0
Electronic_ISBN
978-1-4673-4589-7
Type
conf
DOI
10.1109/3M-NANO.2012.6473000
Filename
6473000
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