Improvement of beam divergence by emission profiles with better homogeneity

Author

Hoppe, P. ; Desjarlais, Michael P. ; Bluhm, H. ; Buth, L. ; Rusch, D. ; Stoltz, O. ; Vath, W.

Author_Institution

Inst. fur Neutronenphys. und Reaktortech., Forschungszentrum Karlsruhe, Germany

Volume

2

fYear

1998

fDate

1998

Firstpage

923

Abstract

Ion beam divergence is influenced by the emission profile of the beam; inhomogeneities can stimulate the transition from the stabilizing diocrotron mode to the detrimental high divergence ion mode. Applied fields for homogeneous beam emission profiles, which differed in strength and tilt, were designed for the KALIF B_appl diode. Experiments were performed on KALIF with these fields. They resulted in the lowest divergences ever measured with this diode. This proves, that the beam emission profile is a controllable key variable to improve the focusing properties of the beam

Keywords

current density; ion sources; KALIF B_appl diode; beam divergence; beam emission profile; detrimental high divergence ion mode; emission profiles; focusing properties; inhomogeneities; ion beam divergence; stabilizing diocrotron mode; Acceleration; Coils; Current density; Diodes; Feeds; Frequency; Ion beams; Magnetic fields; Particle beams; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

High-Power Particle Beams, 1998. BEAMS '98. Proceedings of the 12th International Conference on

Conference_Location

Haifa

Print_ISBN

0-7803-4287-9

Type

conf

DOI

10.1109/BEAMS.1998.817003

Filename

817003