• DocumentCode
    3483177
  • Title

    Beam current and source life enhancement of the Bernas ion source for the Precision Implant 9500xR and xR80

  • Author

    Foad, Majeed A. ; Patel, Devendra ; Burgess, Chris ; Devaney, Andrew

  • Author_Institution
    Implant Div., Appl. Mater., Horsham, UK
  • fYear
    1996
  • fDate
    16-21 Jun 1996
  • Firstpage
    424
  • Lastpage
    427
  • Abstract
    As part of a continuous improvement program, the Bernas ion source used in the Precision Implant 9500xR and the xR80 high current implanters has been further developed. The enhancement involves optimising the position of the filament inside the are chamber and thus the plasma density distribution. This increases the extracted B, BF2, As and P ion beam currents by upto 50%. Source life tests have shown improved lifetime by up to 30%, since the source operates in a more efficient regime. A comparison between the standard source and the enhanced source will be presented, and the processes and mechanisms that limit source lifetime will be discussed
  • Keywords
    ion implantation; ion sources; As; B; BF2; Bernas ion source; P; Precision Implant 9500xR; Precision Implant 9500xR80; beam current; filament position; high current ion implantation; plasma density distribution; source lifetime; Continuous improvement; Foundries; Implants; Ion beams; Ion sources; Life testing; Plasma density; Production; Ultra large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology. Proceedings of the 11th International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-3289-X
  • Type

    conf

  • DOI
    10.1109/IIT.1996.586385
  • Filename
    586385