DocumentCode
3486117
Title
Key technologies of 3D surface inspection for complex workpiece using OMP60 probe
Author
Chen, Yuqing ; Ma, Zi ; Xu, Huipu
Author_Institution
Autom. Res. Center, Dalian Maritime Univ., Dalian, China
fYear
2009
fDate
5-7 Aug. 2009
Firstpage
223
Lastpage
227
Abstract
In this paper, some key technologies of surface inspection are presented. Based on a robot manipulator, a new radius compensation of spherically tipped touch probe is first discussed, and the calibration algorithm for robot hand to eye is proposed. Different from traditional CMM based approach, the point-set registration is derived as a constrained optimization problem, then some issues concerning with the inspection path planning for complex workpiece are described, which is formulated as points distribution, stylus obstacle avoidance and path optimization problems.
Keywords
coordinate measuring machines; manipulator dynamics; path planning; 3D surface inspection; OMP60 probe; complex workpiece; constrained optimization problem; inspection path planning; path optimization problems; point-set registration; points distribution; robot manipulator; spherically tipped touch probe; stylus obstacle avoidance; Calibration; Constraint optimization; Coordinate measuring machines; Inspection; Path planning; Probes; Robot kinematics; Robot sensing systems; Robotics and automation; Service robots; Surface inspection; calibration; path planning; radius compensation; registration;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation and Logistics, 2009. ICAL '09. IEEE International Conference on
Conference_Location
Shenyang
Print_ISBN
978-1-4244-4794-7
Electronic_ISBN
978-1-4244-4795-4
Type
conf
DOI
10.1109/ICAL.2009.5262923
Filename
5262923
Link To Document