DocumentCode
3486473
Title
A succinct memory model for automated design debugging
Author
Keng, Brian ; Mangassarian, Hratch ; Veneris, Andreas
Author_Institution
ECE Dept., Univ. of Toronto, Toronto, ON
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
137
Lastpage
142
Abstract
In todaypsilas complex SoC designs, verification and debugging are becoming ever more crucial and increasingly time-consuming tasks. The prevalence of embedded memories adds to the difficulty of the problem by exponentially increasing the state-space of the design. In this work, a novel memory model for design debugging is presented. It models memory succinctly by avoiding an explicit representation for each memory bit. The method uses the simulation of the erroneous design to guide the debugging process. This results in a parameterizable formal encoding that grows linearly with the erroneous trace length, significantly reducing the memory requirements of the debugging problem. In addition, the proposed model is extended to handle an arbitrary initial memory configuration, as well as non-cycle accurate output traces where only a final expected memory state is available for comparison. Experiments on industrial designs show a 96% average reduction in memory usage along with a noticeable performance improvement compared to previous work.
Keywords
logic design; system-on-chip; SoC designs; arbitrary initial memory configuration; automated design debugging; erroneous trace length; succinct memory model; time-consuming tasks; Clocks; Debugging; Encoding; Error correction; Explosions; Logic arrays; Memory management; Runtime; Sequential circuits; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-2819-9
Electronic_ISBN
1092-3152
Type
conf
DOI
10.1109/ICCAD.2008.4681564
Filename
4681564
Link To Document