• DocumentCode
    3490065
  • Title

    Enhanced tunnel conductance due to QCA cotunneling processes observed for silicon serial triple quantum dots

  • Author

    Yamahata, Gento ; Uchida, Ken ; Oda, Shunri ; Tsuchiya, Yoshishige ; Mizuta, Hiroshi

  • Author_Institution
    Quantum Nanoelectron. Res. Center, Tokyo Inst. of Technol., Tokyo
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    314
  • Lastpage
    317
  • Abstract
    We study single-electron tunneling characteristics of silicon serial triple quantum dots which consist of lithographically-defined double quantum dots interconnected with a naturally-formed and smaller quantum dot. By controlling the single-electron tunneling through the triple quantum dots electrostatically using multiple side gates, the charge stability diagrams are characterized experimentally and theoretically. Several charge quadruple points are observed where sequential tunneling throughout the triple quantum dots is enabled. In addition, enhancement of tunnel conductance is observed along the two-hold degeneracy boundaries across which two electrons exhibit quantum cellular automata (QCA) cotunneling processes.
  • Keywords
    cellular automata; elemental semiconductors; quantum interference phenomena; semiconductor devices; silicon; single electron devices; tunnelling; Si; charge quadruple points; charge stability diagrams; quantum cellular automata cotunneling; sequential tunneling; silicon serial triple quantum dots; single-electron tunneling; tunnel conductance; two-hold degeneracy boundaries; Quantum cellular automata; Quantum dots; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2008. ESSDERC 2008. 38th European
  • Conference_Location
    Edinburgh
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4244-2363-7
  • Electronic_ISBN
    1930-8876
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2008.4681761
  • Filename
    4681761