DocumentCode
3490065
Title
Enhanced tunnel conductance due to QCA cotunneling processes observed for silicon serial triple quantum dots
Author
Yamahata, Gento ; Uchida, Ken ; Oda, Shunri ; Tsuchiya, Yoshishige ; Mizuta, Hiroshi
Author_Institution
Quantum Nanoelectron. Res. Center, Tokyo Inst. of Technol., Tokyo
fYear
2008
fDate
15-19 Sept. 2008
Firstpage
314
Lastpage
317
Abstract
We study single-electron tunneling characteristics of silicon serial triple quantum dots which consist of lithographically-defined double quantum dots interconnected with a naturally-formed and smaller quantum dot. By controlling the single-electron tunneling through the triple quantum dots electrostatically using multiple side gates, the charge stability diagrams are characterized experimentally and theoretically. Several charge quadruple points are observed where sequential tunneling throughout the triple quantum dots is enabled. In addition, enhancement of tunnel conductance is observed along the two-hold degeneracy boundaries across which two electrons exhibit quantum cellular automata (QCA) cotunneling processes.
Keywords
cellular automata; elemental semiconductors; quantum interference phenomena; semiconductor devices; silicon; single electron devices; tunnelling; Si; charge quadruple points; charge stability diagrams; quantum cellular automata cotunneling; sequential tunneling; silicon serial triple quantum dots; single-electron tunneling; tunnel conductance; two-hold degeneracy boundaries; Quantum cellular automata; Quantum dots; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2008. ESSDERC 2008. 38th European
Conference_Location
Edinburgh
ISSN
1930-8876
Print_ISBN
978-1-4244-2363-7
Electronic_ISBN
1930-8876
Type
conf
DOI
10.1109/ESSDERC.2008.4681761
Filename
4681761
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