• DocumentCode
    3490471
  • Title

    Influence of heat sink mounting procedure on package reliability

  • Author

    Yuan, Zhongfa ; Liu, Yong ; Luk, Timwah ; Irving, Scott

  • Author_Institution
    Fairchild Semicond. (Suzhou) Corp., Suzhou
  • fYear
    2008
  • fDate
    20-23 April 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In this paper, a general finite element analysis (FEA) software ANSYSreg is employed to investigate the influence of heat sink mount process on the package reliability. Different leadframe design and leadframe material options for a power packages are provided for modeling optimization. In simulation, the dynamic procedure of heat sink mounting process is simplified as a qusi static problem. A half package model is built due to its symmetrical structure. In addition, the advanced simulation techniques including both contact analysis and pretension method are introduced to simulate the mounting process. Maximum torque within recommended torque range is applied on different package designs for optimization of the mounting process. Meanwhile possible problems with die cracking and EMC can be predicted. In order to verify the results, actual heat sink mounting process is performed with both previous package design and the optimized package design. Comparison between both designs prove that the optimized package designed by simulation is more robust and reliable.
  • Keywords
    die casting; finite element analysis; heat sinks; packaging; ANSYS; contact analysis; die cracking; finite element analysis; half package model; heat sink mounting; leadframe design; leadframe material options; optimization; optimized package design; package designs; package reliability; power packages; pretension method; qusi static problem; Design optimization; Electronic packaging thermal management; Electronics packaging; Fasteners; Heat sinks; Lead; Material properties; Packaging machines; Thermal resistance; Torque;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
  • Conference_Location
    Freiburg im Breisgau
  • Print_ISBN
    978-1-4244-2127-5
  • Electronic_ISBN
    978-1-4244-2128-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2008.4525067
  • Filename
    4525067