DocumentCode
3490508
Title
Radiation and life test procedures for military and aerospace memory components
Author
Chrusciel, Richard W.
fYear
1993
fDate
9-10 Aug 1993
Firstpage
114
Lastpage
118
Abstract
The author presents part qualification, characterization and testing procedures for memory (static/dynamic RAM) components, intended for military and aerospace use. The procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems
Keywords
DRAM chips; SRAM chips; environmental testing; integrated circuit testing; integrated memory circuits; life testing; military equipment; radiation effects; aerospace memory components; characterization; dynamic RAM; life test procedures; military components; part qualification; radiation test procedures; static RAM; Aerospace testing; Costs; DRAM chips; Electric variables measurement; Electronic equipment testing; Life testing; Production systems; Qualifications; Random access memory; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Testing, 1993., Records of the 1993 IEEE International Workshop on
Conference_Location
San Jose, CA
Print_ISBN
0-8186-4150-9
Type
conf
DOI
10.1109/MT.1993.263139
Filename
263139
Link To Document