DocumentCode
3490727
Title
CMOS unclonable system for secure authentication based on device variability
Author
Puntin, D. ; Stanzione, S. ; Iannaccone, G.
Author_Institution
Dipt. di Ing. dell´´Inf.: Elettron., Inf., Telecomun., Univ. di Pisa, Pisa
fYear
2008
fDate
15-19 Sept. 2008
Firstpage
130
Lastpage
133
Abstract
An unclonable system for product authentication in anti-counterfeiting has been implemented in standard 90 nm CMOS technology. The circuit exploits the intrinsic variability of the electrical characteristics of minimum size MOSFETs, in order to generate a physical one-way function that univocally identifies each particular IC. Effects of temperature, voltage supply and process variations have been internally compensated to obtain a robust and reliable behavior. Experimental measurements show that the circuit exhibits 30 muW power consumption, a bit error rate in response to a challenge smaller than 0.4% at 125degC or with a 10% voltage supply variation. Accelerated aging tests provide an estimate of a lifetime much in excess of the ten-year requirement. The very low power consumption makes the circuit also feasible for integration in RFID transponders.
Keywords
CMOS integrated circuits; MOSFET; integrated circuit testing; life testing; CMOS unclonable system; MOSFET; RFID transponders; anti-counterfeiting; bit error rate; power 30 muW; product authentication; secure authentication; size 90 nm; temperature 125 C; Authentication; CMOS technology; Character generation; Circuits; Electric variables; Energy consumption; MOSFETs; Robustness; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
Conference_Location
Edinburgh
ISSN
1930-8833
Print_ISBN
978-1-4244-2361-3
Electronic_ISBN
1930-8833
Type
conf
DOI
10.1109/ESSCIRC.2008.4681809
Filename
4681809
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