Path delay fault testing of Benes multistage interconnection networks

In this paper we present two methods for path delay fault testing of circuit-switched Benes Multistage Interconnection Networks (MINs) with centralized control. Although the number of paths is O(n³), the first method exploiting the inherent parallelism of the Benes MIN requires O(n²) pairs of test vectors. In the second method we propose the selection of a minimal subset of paths, that are robustly testable by only O(log₂n) test vector pairs. The delay along all other paths can be calculated based on the selected path delays